Prediction of leakage power under process uncertainties. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/journals/todaes/ChangS07>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Hongliang_Chang>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Sachin_S._Sapatnekar>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1145%2F1230800.1230804>
foaf:homepage	<https://doi.org/10.1145/1230800.1230804>
dc:identifier	DBLP journals/todaes/ChangS07 (xsd:string)
dc:identifier	DOI doi.org%2F10.1145%2F1230800.1230804 (xsd:string)
dcterms:issued	2007 (xsd:gYear)
swrc:journal	<https://dblp.l3s.de/d2r/resource/journals/todaes>
rdfs:label	Prediction of leakage power under process uncertainties. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Hongliang_Chang>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Sachin_S._Sapatnekar>
swrc:number	2 (xsd:string)
swrc:pages	12 (xsd:string)
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/journals/todaes/ChangS07/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/journals/todaes/ChangS07>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/journals/todaes/todaes12.html#ChangS07>
rdfs:seeAlso	<https://doi.org/10.1145/1230800.1230804>
dc:subject	Circuit, leakage, process variation, yield (xsd:string)
dc:title	Prediction of leakage power under process uncertainties. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:Article
rdf:type	foaf:Document
swrc:volume	12 (xsd:string)