A critical-path-aware partial gating approach for test power reduction.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/todaes/ElShoukryTR07
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2007
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A critical-path-aware partial gating approach for test power reduction.
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Low-power testing, partial gating, scan cell gating, scan testing
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A critical-path-aware partial gating approach for test power reduction.
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