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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/todaes/HongH09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Juinn-Dar_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yu-Ru_Hong>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1497561.1497570>
foaf:homepage <https://doi.org/10.1145/1497561.1497570>
dc:identifier DBLP journals/todaes/HongH09 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1497561.1497570 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/todaes>
rdfs:label Reducing fault dictionary size for million-gate large circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Juinn-Dar_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yu-Ru_Hong>
swrc:number 2 (xsd:string)
swrc:pages 27:1-27:14 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/todaes/HongH09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/todaes/HongH09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/todaes/todaes14.html#HongH09>
rdfs:seeAlso <https://doi.org/10.1145/1497561.1497570>
dc:subject Fault dictionary, diagnostic resolution, fault diagnosis (xsd:string)
dc:title Reducing fault dictionary size for million-gate large circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 14 (xsd:string)