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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/todaes/HsiaoRP00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Elizabeth_M._Rudnick>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Janak_H._Patel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_S._Hsiao>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F348019.348288>
foaf:homepage <https://doi.org/10.1145/348019.348288>
dc:identifier DBLP journals/todaes/HsiaoRP00 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F348019.348288 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/todaes>
rdfs:label Dynamic state traversal for sequential circuit test generation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Elizabeth_M._Rudnick>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Janak_H._Patel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_S._Hsiao>
swrc:number 3 (xsd:string)
swrc:pages 548-565 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/todaes/HsiaoRP00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/todaes/HsiaoRP00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/todaes/todaes5.html#HsiaoRP00>
rdfs:seeAlso <https://doi.org/10.1145/348019.348288>
dc:subject automatic test pattern generation (ATPG), finite-state-machine traversal, genetic algorithms, sequential circuits, simulation-based, testing (xsd:string)
dc:title Dynamic state traversal for sequential circuit test generation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 5 (xsd:string)