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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/todaes/JoneT98>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/K._S._Tsai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wen-Ben_Jone>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F293625.293629>
foaf:homepage <https://doi.org/10.1145/293625.293629>
dc:identifier DBLP journals/todaes/JoneT98 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F293625.293629 (xsd:string)
dcterms:issued 1998 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/todaes>
rdfs:label Confidence analysis for defect-level estimation of VLSI random testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/K._S._Tsai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wen-Ben_Jone>
swrc:number 3 (xsd:string)
swrc:pages 389-407 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/todaes/JoneT98/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/todaes/JoneT98>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/todaes/todaes3.html#JoneT98>
rdfs:seeAlso <https://doi.org/10.1145/293625.293629>
dc:subject VLSI testing, defect level analysis, random testing, test confidence analysis, test quality (xsd:string)
dc:title Confidence analysis for defect-level estimation of VLSI random testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 3 (xsd:string)