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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/todaes/LeeTH99>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jing-Jou_Tang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kuen-Jong_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tsung-Chu_Huang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F307988.307992>
foaf:homepage <https://doi.org/10.1145/307988.307992>
dc:identifier DBLP journals/todaes/LeeTH99 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F307988.307992 (xsd:string)
dcterms:issued 1999 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/todaes>
rdfs:label BIFEST: a built-in intermediate fault effect sensing and test generation system for CMOS bridging faults. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jing-Jou_Tang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kuen-Jong_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tsung-Chu_Huang>
swrc:number 2 (xsd:string)
swrc:pages 194-218 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/todaes/LeeTH99/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/todaes/LeeTH99>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/todaes/todaes4.html#LeeTH99>
rdfs:seeAlso <https://doi.org/10.1145/307988.307992>
dc:title BIFEST: a built-in intermediate fault effect sensing and test generation system for CMOS bridging faults. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 4 (xsd:string)