Test data compression using dictionaries with selective entries and fixed-length indices.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/todaes/LiCT03
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dcterms:
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https://dblp.l3s.de/d2r/resource/authors/Lei_Li_0036
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https://dblp.l3s.de/d2r/resource/authors/Nur_A._Touba
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DBLP journals/todaes/LiCT03
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dcterms:
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2003
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Test data compression using dictionaries with selective entries and fixed-length indices.
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swrc:
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4
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swrc:
pages
470-490
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rdfs:
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dc:
subject
Embedded core testing, SoC testing, reduced pin-count testing, test application time, test data volume
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title
Test data compression using dictionaries with selective entries and fixed-length indices.
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