Efficient techniques for transition testing.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/todaes/LiuHCT05
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dcterms:
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https://dblp.l3s.de/d2r/resource/authors/Xiao_Liu_0010
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dcterms:
issued
2005
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rdfs:
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Efficient techniques for transition testing.
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swrc:
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2
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258-278
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dc:
subject
Test application time reduction, test chain, test data volume reduction, transition faults, yield loss
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dc:
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Efficient techniques for transition testing.
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