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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/todaes/LongIA00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/David_E._Long>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mahesh_A._Iyer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Miron_Abramovici>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F348019.348311>
foaf:homepage <https://doi.org/10.1145/348019.348311>
dc:identifier DBLP journals/todaes/LongIA00 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F348019.348311 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/todaes>
rdfs:label FILL and FUNI: algorithms to identify illegal states and sequentially untestable faults. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/David_E._Long>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mahesh_A._Iyer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Miron_Abramovici>
swrc:number 3 (xsd:string)
swrc:pages 631-657 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/todaes/LongIA00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/todaes/LongIA00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/todaes/todaes5.html#LongIA00>
rdfs:seeAlso <https://doi.org/10.1145/348019.348311>
dc:subject automatic test generation, illegal states, sequential circuits, untestable faults (xsd:string)
dc:title FILL and FUNI: algorithms to identify illegal states and sequentially untestable faults. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 5 (xsd:string)