C-testable bit parallel multipliers over GF(2m).
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/todaes/RahamanMPJ08
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C-testable bit parallel multipliers over GF(2m).
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C-testable, Galois field, TPG, VLSI design, built-in self-test, cryptography, digital signal processing, error control code, fault, multiplier, polynomials, stuck-at fault, testing
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C-testable bit parallel multipliers over GF(2m).
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