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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tpds/FujiwaraI95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tomoo_Inoue>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F71.395397>
foaf:homepage <https://doi.org/10.1109/71.395397>
dc:identifier DBLP journals/tpds/FujiwaraI95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F71.395397 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tpds>
rdfs:label Optimal Granularity and Scheme of Parallel Test Generation in a Distributed System. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tomoo_Inoue>
swrc:number 7 (xsd:string)
swrc:pages 677-686 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tpds/FujiwaraI95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tpds/FujiwaraI95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tpds/tpds6.html#FujiwaraI95>
rdfs:seeAlso <https://doi.org/10.1109/71.395397>
dc:subject Combinational circuits, client-server model, distributed systems, fault simulation, granularity, parallel processing, test generation. (xsd:string)
dc:title Optimal Granularity and Scheme of Parallel Test Generation in a Distributed System. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 6 (xsd:string)