A Diagnosis Algorithm for Constant Degree Structures and Its Application to VLSI Circuit Testing.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tpds/HuangALT95
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/tpds/HuangALT95
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Kaiyuan_Huang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Krishnaiyan_Thulasiraman
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Laurence_E._LaForge
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Vinod_K._Agarwal
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2F71.372790
>
foaf:
homepage
<
https://doi.org/10.1109/71.372790
>
dc:
identifier
DBLP journals/tpds/HuangALT95
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2F71.372790
(xsd:string)
dcterms:
issued
1995
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/tpds
>
rdfs:
label
A Diagnosis Algorithm for Constant Degree Structures and Its Application to VLSI Circuit Testing.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Kaiyuan_Huang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Krishnaiyan_Thulasiraman
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Laurence_E._LaForge
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Vinod_K._Agarwal
>
swrc:
number
4
(xsd:string)
swrc:
pages
363-372
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/tpds/HuangALT95/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/tpds/HuangALT95
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/tpds/tpds6.html#HuangALT95
>
rdfs:
seeAlso
<
https://doi.org/10.1109/71.372790
>
dc:
title
A Diagnosis Algorithm for Constant Degree Structures and Its Application to VLSI Circuit Testing.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
6
(xsd:string)