[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tr/BarnettSN03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Adit_D._Singh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thomas_S._Barnett>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Victor_P._Nelson>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTR.2003.816418>
foaf:homepage <https://doi.org/10.1109/TR.2003.816418>
dc:identifier DBLP journals/tr/BarnettSN03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTR.2003.816418 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tr>
rdfs:label Extending integrated-circuit yield-models to estimate early-life reliability. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Adit_D._Singh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thomas_S._Barnett>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Victor_P._Nelson>
swrc:number 3 (xsd:string)
swrc:pages 296-300 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tr/BarnettSN03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tr/BarnettSN03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tr/tr52.html#BarnettSN03>
rdfs:seeAlso <https://doi.org/10.1109/TR.2003.816418>
dc:title Extending integrated-circuit yield-models to estimate early-life reliability. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 52 (xsd:string)