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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tr/DilhaireGJC04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S%E2%88%9A%C2%A9bastien_Jorez>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/St%E2%88%9A%C2%A9phane_Grauby>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stefan_Dilhaire>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wilfrid_Claeys>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTR.2004.829165>
foaf:homepage <https://doi.org/10.1109/TR.2004.829165>
dc:identifier DBLP journals/tr/DilhaireGJC04 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTR.2004.829165 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tr>
rdfs:label Strain energy imaging of a power MOS transistor using speckle interferometry. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S%E2%88%9A%C2%A9bastien_Jorez>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/St%E2%88%9A%C2%A9phane_Grauby>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stefan_Dilhaire>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wilfrid_Claeys>
swrc:number 2 (xsd:string)
swrc:pages 293-296 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tr/DilhaireGJC04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tr/DilhaireGJC04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tr/tr53.html#DilhaireGJC04>
rdfs:seeAlso <https://doi.org/10.1109/TR.2004.829165>
dc:title Strain energy imaging of a power MOS transistor using speckle interferometry. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 53 (xsd:string)