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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tr/GhoneimRYBH15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chadwin_D._Young>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gennadi_Bersuker>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jhonathan_P._Rojas>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mohamed_T._Ghoneim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Muhammad_Mustafa_Hussain>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTR.2014.2371054>
foaf:homepage <https://doi.org/10.1109/TR.2014.2371054>
dc:identifier DBLP journals/tr/GhoneimRYBH15 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTR.2014.2371054 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tr>
rdfs:label Electrical Analysis of High Dielectric Constant Insulator and Metal Gate Metal Oxide Semiconductor Capacitors on Flexible Bulk Mono-Crystalline Silicon. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chadwin_D._Young>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gennadi_Bersuker>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jhonathan_P._Rojas>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mohamed_T._Ghoneim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Muhammad_Mustafa_Hussain>
swrc:number 2 (xsd:string)
swrc:pages 579-585 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tr/GhoneimRYBH15/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tr/GhoneimRYBH15>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tr/tr64.html#GhoneimRYBH15>
rdfs:seeAlso <https://doi.org/10.1109/TR.2014.2371054>
dc:title Electrical Analysis of High Dielectric Constant Insulator and Metal Gate Metal Oxide Semiconductor Capacitors on Flexible Bulk Mono-Crystalline Silicon. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 64 (xsd:string)