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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tr/IngermannF96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Erik_H._Ingermann>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/James_F._Frenzel>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F24.510801>
foaf:homepage <https://doi.org/10.1109/24.510801>
dc:identifier DBLP journals/tr/IngermannF96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F24.510801 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tr>
rdfs:label Behavior of a radiation-immune CMOS logic family under resistive shorts. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Erik_H._Ingermann>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/James_F._Frenzel>
swrc:number 2 (xsd:string)
swrc:pages 194-199 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tr/IngermannF96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tr/IngermannF96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tr/tr45.html#IngermannF96>
rdfs:seeAlso <https://doi.org/10.1109/24.510801>
dc:title Behavior of a radiation-immune CMOS logic family under resistive shorts. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 45 (xsd:string)