Effect of CVD-SiO2 film on reliability of GaAs MESFET with Ti/Pt/Au gate metal.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tr/SaitoHN05
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Effect of CVD-SiO2 film on reliability of GaAs MESFET with Ti/Pt/Au gate metal.
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Effect of CVD-SiO2 film on reliability of GaAs MESFET with Ti/Pt/Au gate metal.
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