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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/trets/AhmedZMTB19>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ibrahim_Ahmed_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/James_Meijers>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Olivier_Trescases>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shuze_Zhao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vaughn_Betz>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F3354188>
foaf:homepage <https://doi.org/10.1145/3354188>
dc:identifier DBLP journals/trets/AhmedZMTB19 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F3354188 (xsd:string)
dcterms:issued 2019 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/trets>
rdfs:label FRoC 2.0: Automatic BRAM and Logic Testing to Enable Dynamic Voltage Scaling for FPGA Applications. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ibrahim_Ahmed_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/James_Meijers>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Olivier_Trescases>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shuze_Zhao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vaughn_Betz>
swrc:number 4 (xsd:string)
swrc:pages 20:1-20:28 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/trets/AhmedZMTB19/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/trets/AhmedZMTB19>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/trets/trets12.html#AhmedZMTB19>
rdfs:seeAlso <https://doi.org/10.1145/3354188>
dc:title FRoC 2.0: Automatic BRAM and Logic Testing to Enable Dynamic Voltage Scaling for FPGA Applications. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 12 (xsd:string)