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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/trob/JengX01a>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/MuDer_Jeng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaolan_Xie>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F70.964659>
foaf:homepage <https://doi.org/10.1109/70.964659>
dc:identifier DBLP journals/trob/JengX01a (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F70.964659 (xsd:string)
dcterms:issued 2001 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/trob>
rdfs:label Modeling and analysis of semiconductor manufacturing systems with degraded behavior using Petri nets and siphons. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/MuDer_Jeng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaolan_Xie>
swrc:number 5 (xsd:string)
swrc:pages 576-588 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/trob/JengX01a/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/trob/JengX01a>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/trob/trob17.html#JengX01a>
rdfs:seeAlso <https://doi.org/10.1109/70.964659>
dc:title Modeling and analysis of semiconductor manufacturing systems with degraded behavior using Petri nets and siphons. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 17 (xsd:string)