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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tse/ChenM96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sanping_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shirley_Mills>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F32.489081>
foaf:homepage <https://doi.org/10.1109/32.489081>
dc:identifier DBLP journals/tse/ChenM96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F32.489081 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tse>
rdfs:label A Binary Markov Process Model for Random Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sanping_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shirley_Mills>
swrc:number 3 (xsd:string)
swrc:pages 218-223 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tse/ChenM96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tse/ChenM96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tse/tse22.html#ChenM96>
rdfs:seeAlso <https://doi.org/10.1109/32.489081>
dc:subject Binary Markov process, dependent test runs, random testing, software reliability, statistical testing, ultra-reliability application. (xsd:string)
dc:title A Binary Markov Process Model for Random Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 22 (xsd:string)