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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tse/ChillaregeBCHMRW92>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bonnie_K._Ray>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Diane_S._Moebus>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Inderpal_S._Bhandari>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jarir_K._Chaar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Man-Yuen_Wong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_J._Halliday>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ram_Chillarege>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F32.177364>
foaf:homepage <https://doi.org/10.1109/32.177364>
dc:identifier DBLP journals/tse/ChillaregeBCHMRW92 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F32.177364 (xsd:string)
dcterms:issued 1992 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tse>
rdfs:label Orthogonal Defect Classification - A Concept for In-Process Measurements. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bonnie_K._Ray>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Diane_S._Moebus>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Inderpal_S._Bhandari>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jarir_K._Chaar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Man-Yuen_Wong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_J._Halliday>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ram_Chillarege>
swrc:number 11 (xsd:string)
swrc:pages 943-956 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tse/ChillaregeBCHMRW92/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tse/ChillaregeBCHMRW92>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tse/tse18.html#ChillaregeBCHMRW92>
rdfs:seeAlso <https://doi.org/10.1109/32.177364>
dc:subject orthogonal defect classification; software development; in-process measurements; feedback; semantic information; cause-effect relationships; measurement and analysis methods; necessary and sufficient conditions; defect trigger distribution; completeness; verification processes; inspection; testing; software quality; software reliability (xsd:string)
dc:title Orthogonal Defect Classification - A Concept for In-Process Measurements. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 18 (xsd:string)