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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tse/HaiderCCDH08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jo%E2%88%9A%C2%A3o_W._Cangussu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kendra_M._L._Cooper>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ram_Dantu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Syed_Haider>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Syed_Waseem_Haider>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTSE.2008.23>
foaf:homepage <https://doi.org/10.1109/TSE.2008.23>
dc:identifier DBLP journals/tse/HaiderCCDH08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTSE.2008.23 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tse>
rdfs:label Estimation of Defects Based on Defect Decay Model: ED^{3}M. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jo%E2%88%9A%C2%A3o_W._Cangussu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kendra_M._L._Cooper>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ram_Dantu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Syed_Haider>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Syed_Waseem_Haider>
swrc:number 3 (xsd:string)
swrc:pages 336-356 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tse/HaiderCCDH08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tse/HaiderCCDH08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tse/tse34.html#HaiderCCDH08>
rdfs:seeAlso <https://doi.org/10.1109/TSE.2008.23>
dc:subject Statistical methods, Testing and Debugging, Metrics/Measurement, Defect prediction, system testing, estimation theory (xsd:string)
dc:title Estimation of Defects Based on Defect Decay Model: ED^{3}M. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 34 (xsd:string)