[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tse/KrishnanK99>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marc_I._Kellner>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mayuram_S._Krishnan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F32.824401>
foaf:homepage <https://doi.org/10.1109/32.824401>
dc:identifier DBLP journals/tse/KrishnanK99 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F32.824401 (xsd:string)
dcterms:issued 1999 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tse>
rdfs:label Measuring Process Consistency: Implications for Reducing Software Defects. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marc_I._Kellner>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mayuram_S._Krishnan>
swrc:number 6 (xsd:string)
swrc:pages 800-815 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tse/KrishnanK99/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tse/KrishnanK99>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tse/tse25.html#KrishnanK99>
rdfs:seeAlso <https://doi.org/10.1109/32.824401>
dc:subject Software process consistency, software process measurement, CMM, software defects, empirical model. (xsd:string)
dc:title Measuring Process Consistency: Implications for Reducing Software Defects. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 25 (xsd:string)