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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tse/PaiD07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ganesh_J._Pai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Joanne_Bechta_Dugan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTSE.2007.70722>
foaf:homepage <https://doi.org/10.1109/TSE.2007.70722>
dc:identifier DBLP journals/tse/PaiD07 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTSE.2007.70722 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tse>
rdfs:label Empirical Analysis of Software Fault Content and Fault Proneness Using Bayesian Methods. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ganesh_J._Pai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Joanne_Bechta_Dugan>
swrc:number 10 (xsd:string)
swrc:pages 675-686 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tse/PaiD07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tse/PaiD07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tse/tse33.html#PaiD07>
rdfs:seeAlso <https://doi.org/10.1109/TSE.2007.70722>
dc:subject Bayesian analysis, Bayesian networks, defects, fault proneness, metrics, object-oriented, regression, software quality (xsd:string)
dc:title Empirical Analysis of Software Fault Content and Fault Proneness Using Bayesian Methods. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 33 (xsd:string)