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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tsmc/JengXC04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/MuDer_Jeng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sheng-Luen_Chung>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaolan_Xie>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTSMCA.2003.820579>
foaf:homepage <https://doi.org/10.1109/TSMCA.2003.820579>
dc:identifier DBLP journals/tsmc/JengXC04 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTSMCA.2003.820579 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tsmc>
rdfs:label ERCN* merged nets for modeling degraded behavior and parallel processes in semiconductor manufacturing systems. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/MuDer_Jeng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sheng-Luen_Chung>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaolan_Xie>
swrc:number 1 (xsd:string)
swrc:pages 102-112 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tsmc/JengXC04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tsmc/JengXC04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tsmc/tsmca34.html#JengXC04>
rdfs:seeAlso <https://doi.org/10.1109/TSMCA.2003.820579>
dc:title ERCN* merged nets for modeling degraded behavior and parallel processes in semiconductor manufacturing systems. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 34 (xsd:string)