Special Issue on Critical Reliability Challenges and Practices [Guest Editorial].
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tsmc/Pham07
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/tsmc/Pham07
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dc:
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<
https://dblp.l3s.de/d2r/resource/authors/Hoang_Pham
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<
http://dx.doi.org/doi.org%2F10.1109%2FTSMCA.2007.891923
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DBLP journals/tsmc/Pham07
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issued
2007
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https://dblp.l3s.de/d2r/resource/journals/tsmc
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Special Issue on Critical Reliability Challenges and Practices [Guest Editorial].
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<
https://dblp.l3s.de/d2r/resource/authors/Hoang_Pham
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2
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swrc:
pages
141-142
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rdfs:
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http://dblp.uni-trier.de/db/journals/tsmc/tsmca37.html#Pham07
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rdfs:
seeAlso
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dc:
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Special Issue on Critical Reliability Challenges and Practices [Guest Editorial].
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