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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tsmc/RozinatJGA09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anne_Rozinat>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christian_W._G%E2%88%9A%C4%BEnther>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ivo_S._M._de_Jong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wil_M._P._van_der_Aalst>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTSMCC.2009.2014169>
foaf:homepage <https://doi.org/10.1109/TSMCC.2009.2014169>
dc:identifier DBLP journals/tsmc/RozinatJGA09 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTSMCC.2009.2014169 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tsmc>
rdfs:label Process Mining Applied to the Test Process of Wafer Scanners in ASML. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anne_Rozinat>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christian_W._G%E2%88%9A%C4%BEnther>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ivo_S._M._de_Jong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wil_M._P._van_der_Aalst>
swrc:number 4 (xsd:string)
swrc:pages 474-479 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tsmc/RozinatJGA09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tsmc/RozinatJGA09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tsmc/tsmcc39.html#RozinatJGA09>
rdfs:seeAlso <https://doi.org/10.1109/TSMCC.2009.2014169>
dc:title Process Mining Applied to the Test Process of Wafer Scanners in ASML. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 39 (xsd:string)