Path Planning of Randomly Scattering Waypoints for Wafer Probing Based on Deep Attention Mechanism.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tsmc/ShiLLHHH23
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/tsmc/ShiLLHHH23
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Haobin_Shi
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jingchen_Li
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Kao-Shing_Hwang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Maxwell_Hwang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Meng_Liang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yun-Yu_Hsu
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FTSMC.2022.3184155
>
foaf:
homepage
<
https://doi.org/10.1109/TSMC.2022.3184155
>
dc:
identifier
DBLP journals/tsmc/ShiLLHHH23
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FTSMC.2022.3184155
(xsd:string)
dcterms:
issued
2023
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/tsmc
>
rdfs:
label
Path Planning of Randomly Scattering Waypoints for Wafer Probing Based on Deep Attention Mechanism.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Haobin_Shi
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jingchen_Li
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Kao-Shing_Hwang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Maxwell_Hwang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Meng_Liang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yun-Yu_Hsu
>
swrc:
number
1
(xsd:string)
swrc:
pages
529-541
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/tsmc/ShiLLHHH23/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/tsmc/ShiLLHHH23
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/tsmc/tsmc53.html#ShiLLHHH23
>
rdfs:
seeAlso
<
https://doi.org/10.1109/TSMC.2022.3184155
>
dc:
title
Path Planning of Randomly Scattering Waypoints for Wafer Probing Based on Deep Attention Mechanism.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
53
(xsd:string)