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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tvlsi/AshoueiCS10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Adit_D._Singh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Maryam_Ashouei>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTVLSI.2009.2014559>
foaf:homepage <https://doi.org/10.1109/TVLSI.2009.2014559>
dc:identifier DBLP journals/tvlsi/AshoueiCS10 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTVLSI.2009.2014559 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tvlsi>
rdfs:label Post-Manufacture Tuning for Nano-CMOS Yield Recovery Using Reconfigurable Logic. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Adit_D._Singh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Maryam_Ashouei>
swrc:number 4 (xsd:string)
swrc:pages 675-679 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tvlsi/AshoueiCS10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tvlsi/AshoueiCS10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi18.html#AshoueiCS10>
rdfs:seeAlso <https://doi.org/10.1109/TVLSI.2009.2014559>
dc:title Post-Manufacture Tuning for Nano-CMOS Yield Recovery Using Reconfigurable Logic. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 18 (xsd:string)