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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tvlsi/AzevedoVBDGTAM14>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Aida_Todri-Sanial>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alberto_Bosio>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Arnaud_Virazel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J%E2%88%9A%C2%A9r%E2%88%9A%C2%A9my_Alvarez-Herault>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Joao_Azevedo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ken_Mackay>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Luigi_Dilillo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Patrick_Girard_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTVLSI.2013.2294080>
foaf:homepage <https://doi.org/10.1109/TVLSI.2013.2294080>
dc:identifier DBLP journals/tvlsi/AzevedoVBDGTAM14 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTVLSI.2013.2294080 (xsd:string)
dcterms:issued 2014 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tvlsi>
rdfs:label A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Aida_Todri-Sanial>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alberto_Bosio>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Arnaud_Virazel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J%E2%88%9A%C2%A9r%E2%88%9A%C2%A9my_Alvarez-Herault>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Joao_Azevedo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ken_Mackay>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Luigi_Dilillo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Patrick_Girard_0001>
swrc:number 11 (xsd:string)
swrc:pages 2326-2335 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tvlsi/AzevedoVBDGTAM14/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tvlsi/AzevedoVBDGTAM14>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi22.html#AzevedoVBDGTAM14>
rdfs:seeAlso <https://doi.org/10.1109/TVLSI.2013.2294080>
dc:title A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 22 (xsd:string)