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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tvlsi/ChenLRK09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cheng-Kok_Koh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hai_Li_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yiran_Chen_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTVLSI.2008.2007843>
foaf:homepage <https://doi.org/10.1109/TVLSI.2008.2007843>
dc:identifier DBLP journals/tvlsi/ChenLRK09 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTVLSI.2008.2007843 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tvlsi>
rdfs:label Gated Decap: Gate Leakage Control of On-Chip Decoupling Capacitors in Scaled Technologies. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cheng-Kok_Koh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hai_Li_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yiran_Chen_0001>
swrc:number 12 (xsd:string)
swrc:pages 1749-1752 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tvlsi/ChenLRK09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tvlsi/ChenLRK09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi17.html#ChenLRK09>
rdfs:seeAlso <https://doi.org/10.1109/TVLSI.2008.2007843>
dc:title Gated Decap: Gate Leakage Control of On-Chip Decoupling Capacitors in Scaled Technologies. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 17 (xsd:string)