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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tvlsi/ChenMBR05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hamid_Mahmoodi-Meimand>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Qikai_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Swarup_Bhunia>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTVLSI.2005.859565>
foaf:homepage <https://doi.org/10.1109/TVLSI.2005.859565>
dc:identifier DBLP journals/tvlsi/ChenMBR05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTVLSI.2005.859565 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tvlsi>
rdfs:label Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hamid_Mahmoodi-Meimand>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Qikai_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Swarup_Bhunia>
swrc:number 11 (xsd:string)
swrc:pages 1286-1295 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tvlsi/ChenMBR05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tvlsi/ChenMBR05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi13.html#ChenMBR05>
rdfs:seeAlso <https://doi.org/10.1109/TVLSI.2005.859565>
dc:title Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 13 (xsd:string)