Design of a self-testing and self-repairing structure for highly hierarchical ultra-large capacity memory chips.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tvlsi/ChenS93
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Design of a self-testing and self-repairing structure for highly hierarchical ultra-large capacity memory chips.
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Design of a self-testing and self-repairing structure for highly hierarchical ultra-large capacity memory chips.
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