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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tvlsi/EschC04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gerald_Esch_Jr.>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tom_Chen_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTVLSI.2004.836321>
foaf:homepage <https://doi.org/10.1109/TVLSI.2004.836321>
dc:identifier DBLP journals/tvlsi/EschC04 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTVLSI.2004.836321 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tvlsi>
rdfs:label Near-linear CMOS I/O driver with less sensitivity to process, voltage, and temperature variations. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gerald_Esch_Jr.>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tom_Chen_0001>
swrc:number 11 (xsd:string)
swrc:pages 1253-1257 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tvlsi/EschC04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tvlsi/EschC04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi12.html#EschC04>
rdfs:seeAlso <https://doi.org/10.1109/TVLSI.2004.836321>
dc:title Near-linear CMOS I/O driver with less sensitivity to process, voltage, and temperature variations. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 12 (xsd:string)