Analysis of resistive bridging fault detection in BiCMOS digital ICs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tvlsi/FavalliDOR93
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/tvlsi/FavalliDOR93
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Bruno_Ricc%E2%88%9A%E2%89%A4
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Marcello_Dalpasso
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Michele_Favalli
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Piero_Olivo
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2F92.238451
>
foaf:
homepage
<
https://doi.org/10.1109/92.238451
>
dc:
identifier
DBLP journals/tvlsi/FavalliDOR93
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2F92.238451
(xsd:string)
dcterms:
issued
1993
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/tvlsi
>
rdfs:
label
Analysis of resistive bridging fault detection in BiCMOS digital ICs.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Bruno_Ricc%E2%88%9A%E2%89%A4
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Marcello_Dalpasso
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Michele_Favalli
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Piero_Olivo
>
swrc:
number
3
(xsd:string)
swrc:
pages
342-355
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/tvlsi/FavalliDOR93/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/tvlsi/FavalliDOR93
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi1.html#FavalliDOR93
>
rdfs:
seeAlso
<
https://doi.org/10.1109/92.238451
>
dc:
title
Analysis of resistive bridging fault detection in BiCMOS digital ICs.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
1
(xsd:string)