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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tvlsi/HeCTWT17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dat_Tran>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gustavo_K._Contreras>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/LeRoy_Winemberg>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mark_M._Tehranipoor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Miao_Tony_He>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTVLSI.2017.2704104>
foaf:homepage <https://doi.org/10.1109/TVLSI.2017.2704104>
dc:identifier DBLP journals/tvlsi/HeCTWT17 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTVLSI.2017.2704104 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tvlsi>
rdfs:label Test-Point Insertion Efficiency Analysis for LBIST in High-Assurance Applications. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dat_Tran>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gustavo_K._Contreras>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/LeRoy_Winemberg>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mark_M._Tehranipoor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Miao_Tony_He>
swrc:number 9 (xsd:string)
swrc:pages 2602-2615 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tvlsi/HeCTWT17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tvlsi/HeCTWT17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi25.html#HeCTWT17>
rdfs:seeAlso <https://doi.org/10.1109/TVLSI.2017.2704104>
dc:title Test-Point Insertion Efficiency Analysis for LBIST in High-Assurance Applications. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 25 (xsd:string)