Low-Cost Self-Test Techniques for Small RAMs in SOCs Using Enhanced IEEE 1500 Test Wrappers.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tvlsi/HuangL12
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Low-Cost Self-Test Techniques for Small RAMs in SOCs Using Enhanced IEEE 1500 Test Wrappers.
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Low-Cost Self-Test Techniques for Small RAMs in SOCs Using Enhanced IEEE 1500 Test Wrappers.
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