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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tvlsi/JinEES01>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jongin_Shim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/William_R._Eisenstadt>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Woojin_Jin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yungseon_Eo>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F92.929579>
foaf:homepage <https://doi.org/10.1109/92.929579>
dc:identifier DBLP journals/tvlsi/JinEES01 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F92.929579 (xsd:string)
dcterms:issued 2001 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tvlsi>
rdfs:label Fast and accurate quasi-three-dimensional capacitance determination of multilayer VLSI interconnects. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jongin_Shim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/William_R._Eisenstadt>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Woojin_Jin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yungseon_Eo>
swrc:number 3 (xsd:string)
swrc:pages 450-460 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tvlsi/JinEES01/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tvlsi/JinEES01>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi9.html#JinEES01>
rdfs:seeAlso <https://doi.org/10.1109/92.929579>
dc:title Fast and accurate quasi-three-dimensional capacitance determination of multilayer VLSI interconnects. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 9 (xsd:string)