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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tvlsi/KeaneEKSK08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chris_H._Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hanyong_Eom>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/John_Keane_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sachin_S._Sapatnekar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tony_Tae-Hyoung_Kim>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTVLSI.2008.917571>
foaf:homepage <https://doi.org/10.1109/TVLSI.2008.917571>
dc:identifier DBLP journals/tvlsi/KeaneEKSK08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTVLSI.2008.917571 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tvlsi>
rdfs:label Stack Sizing for Optimal Current Drivability in Subthreshold Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chris_H._Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hanyong_Eom>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/John_Keane_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sachin_S._Sapatnekar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tony_Tae-Hyoung_Kim>
swrc:number 5 (xsd:string)
swrc:pages 598-602 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tvlsi/KeaneEKSK08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tvlsi/KeaneEKSK08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi16.html#KeaneEKSK08>
rdfs:seeAlso <https://doi.org/10.1109/TVLSI.2008.917571>
dc:title Stack Sizing for Optimal Current Drivability in Subthreshold Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 16 (xsd:string)