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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tvlsi/KeshavarziRHD03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ali_Keshavarzi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Charles_F._Hawkins>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vivek_De>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTVLSI.2003.812298>
foaf:homepage <https://doi.org/10.1109/TVLSI.2003.812298>
dc:identifier DBLP journals/tvlsi/KeshavarziRHD03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTVLSI.2003.812298 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tvlsi>
rdfs:label Multiple-parameter CMOS IC testing with increased sensitivity for IDDQ. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ali_Keshavarzi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Charles_F._Hawkins>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vivek_De>
swrc:number 5 (xsd:string)
swrc:pages 863-870 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tvlsi/KeshavarziRHD03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tvlsi/KeshavarziRHD03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi11.html#KeshavarziRHD03>
rdfs:seeAlso <https://doi.org/10.1109/TVLSI.2003.812298>
dc:title Multiple-parameter CMOS IC testing with increased sensitivity for IDDQ. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 11 (xsd:string)