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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tvlsi/KimCKM16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chang-Chih_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dae_Hyun_Kim_0003>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Linda_Milor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Woongrae_Kim>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTVLSI.2015.2513369>
foaf:homepage <https://doi.org/10.1109/TVLSI.2015.2513369>
dc:identifier DBLP journals/tvlsi/KimCKM16 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTVLSI.2015.2513369 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tvlsi>
rdfs:label Built-In Self-Test Methodology With Statistical Analysis for Electrical Diagnosis of Wearout in a Static Random Access Memory Array. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chang-Chih_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dae_Hyun_Kim_0003>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Linda_Milor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Woongrae_Kim>
swrc:number 7 (xsd:string)
swrc:pages 2521-2534 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tvlsi/KimCKM16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tvlsi/KimCKM16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi24.html#KimCKM16>
rdfs:seeAlso <https://doi.org/10.1109/TVLSI.2015.2513369>
dc:title Built-In Self-Test Methodology With Statistical Analysis for Electrical Diagnosis of Wearout in a Static Random Access Memory Array. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 24 (xsd:string)