[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tvlsi/KimLJK15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chris_H._Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Keith_A._Jenkins>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pong-Fei_Lu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tony_Tae-Hyoung_Kim>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTVLSI.2014.2339364>
foaf:homepage <https://doi.org/10.1109/TVLSI.2014.2339364>
dc:identifier DBLP journals/tvlsi/KimLJK15 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTVLSI.2014.2339364 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tvlsi>
rdfs:label A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of NBTI and PBTI in High-k/Metal Gate Technology. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chris_H._Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Keith_A._Jenkins>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pong-Fei_Lu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tony_Tae-Hyoung_Kim>
swrc:number 7 (xsd:string)
swrc:pages 1360-1364 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tvlsi/KimLJK15/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tvlsi/KimLJK15>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi23.html#KimLJK15>
rdfs:seeAlso <https://doi.org/10.1109/TVLSI.2014.2339364>
dc:title A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of NBTI and PBTI in High-k/Metal Gate Technology. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 23 (xsd:string)