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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tvlsi/KumarABFS20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Binod_Kumar_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jay_Adhaduk>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kanad_Basu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masahiro_Fujita>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Virendra_Singh>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTVLSI.2019.2958989>
foaf:homepage <https://doi.org/10.1109/TVLSI.2019.2958989>
dc:identifier DBLP journals/tvlsi/KumarABFS20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTVLSI.2019.2958989 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tvlsi>
rdfs:label A Methodology to Capture Fine-Grained Internal Visibility During Multisession Silicon Debug. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Binod_Kumar_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jay_Adhaduk>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kanad_Basu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masahiro_Fujita>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Virendra_Singh>
swrc:number 4 (xsd:string)
swrc:pages 1002-1015 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tvlsi/KumarABFS20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tvlsi/KumarABFS20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi28.html#KumarABFS20>
rdfs:seeAlso <https://doi.org/10.1109/TVLSI.2019.2958989>
dc:title A Methodology to Capture Fine-Grained Internal Visibility During Multisession Silicon Debug. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 28 (xsd:string)