[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tvlsi/LingappanJ07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Loganathan_Lingappan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Niraj_K._Jha>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTVLSI.2007.896908>
foaf:homepage <https://doi.org/10.1109/TVLSI.2007.896908>
dc:identifier DBLP journals/tvlsi/LingappanJ07 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTVLSI.2007.896908 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tvlsi>
rdfs:label Satisfiability-Based Automatic Test Program Generation and Design for Testability for Microprocessors. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Loganathan_Lingappan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Niraj_K._Jha>
swrc:number 5 (xsd:string)
swrc:pages 518-530 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tvlsi/LingappanJ07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tvlsi/LingappanJ07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi15.html#LingappanJ07>
rdfs:seeAlso <https://doi.org/10.1109/TVLSI.2007.896908>
dc:title Satisfiability-Based Automatic Test Program Generation and Design for Testability for Microprocessors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 15 (xsd:string)