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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tvlsi/MajumderHUR19>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Garrett_S._Rose>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Md._Badruddoja_Majumder>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Md_Sakib_Hasan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mesbah_Uddin>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTVLSI.2018.2876693>
foaf:homepage <https://doi.org/10.1109/TVLSI.2018.2876693>
dc:identifier DBLP journals/tvlsi/MajumderHUR19 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTVLSI.2018.2876693 (xsd:string)
dcterms:issued 2019 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tvlsi>
rdfs:label A Secure Integrity Checking System for Nanoelectronic Resistive RAM. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Garrett_S._Rose>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Md._Badruddoja_Majumder>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Md_Sakib_Hasan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mesbah_Uddin>
swrc:number 2 (xsd:string)
swrc:pages 416-429 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tvlsi/MajumderHUR19/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tvlsi/MajumderHUR19>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi27.html#MajumderHUR19>
rdfs:seeAlso <https://doi.org/10.1109/TVLSI.2018.2876693>
dc:title A Secure Integrity Checking System for Nanoelectronic Resistive RAM. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 27 (xsd:string)