Bias-Dependent Variation in FinFET SRAM.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tvlsi/MannZKCPKHVC20
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/tvlsi/MannZKCPKHVC20
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jack_M._Higman
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Joseph_Versaggi
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Meixiong_Zhao
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Muhammed_Ahosan_Ul_Karim
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Oh_Sung_Kwon
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Randy_W._Mann
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Rick_Carter
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Sanjay_Parihar
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Xi_Cao
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FTVLSI.2020.2974202
>
foaf:
homepage
<
https://doi.org/10.1109/TVLSI.2020.2974202
>
dc:
identifier
DBLP journals/tvlsi/MannZKCPKHVC20
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FTVLSI.2020.2974202
(xsd:string)
dcterms:
issued
2020
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/tvlsi
>
rdfs:
label
Bias-Dependent Variation in FinFET SRAM.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jack_M._Higman
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Joseph_Versaggi
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Meixiong_Zhao
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Muhammed_Ahosan_Ul_Karim
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Oh_Sung_Kwon
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Randy_W._Mann
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Rick_Carter
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Sanjay_Parihar
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Xi_Cao
>
swrc:
number
5
(xsd:string)
swrc:
pages
1341-1344
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/tvlsi/MannZKCPKHVC20/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/tvlsi/MannZKCPKHVC20
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi28.html#MannZKCPKHVC20
>
rdfs:
seeAlso
<
https://doi.org/10.1109/TVLSI.2020.2974202
>
dc:
title
Bias-Dependent Variation in FinFET SRAM.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
28
(xsd:string)