Hard-to-Detect Fault Analysis in FinFET SRAMs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/tvlsi/MedeirosFWTPH21
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/tvlsi/MedeirosFWTPH21
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Guilherme_Cardoso_Medeiros
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Let%E2%88%9A%E2%89%A0cia_Maria_Bolzani_Poehls
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Lizhou_Wu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Moritz_Fieback
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Mottaqiallah_Taouil
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FTVLSI.2021.3071940
>
foaf:
homepage
<
https://doi.org/10.1109/TVLSI.2021.3071940
>
dc:
identifier
DBLP journals/tvlsi/MedeirosFWTPH21
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FTVLSI.2021.3071940
(xsd:string)
dcterms:
issued
2021
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/tvlsi
>
rdfs:
label
Hard-to-Detect Fault Analysis in FinFET SRAMs.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Guilherme_Cardoso_Medeiros
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Let%E2%88%9A%E2%89%A0cia_Maria_Bolzani_Poehls
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Lizhou_Wu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Moritz_Fieback
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Mottaqiallah_Taouil
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui
>
swrc:
number
6
(xsd:string)
swrc:
pages
1271-1284
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/tvlsi/MedeirosFWTPH21/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/tvlsi/MedeirosFWTPH21
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi29.html#MedeirosFWTPH21
>
rdfs:
seeAlso
<
https://doi.org/10.1109/TVLSI.2021.3071940
>
dc:
title
Hard-to-Detect Fault Analysis in FinFET SRAMs.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
29
(xsd:string)