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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tvlsi/ShaerAL00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bassam_Shaer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/David_L._Landis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sami_A._Al-Arian>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F92.894159>
foaf:homepage <https://doi.org/10.1109/92.894159>
dc:identifier DBLP journals/tvlsi/ShaerAL00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F92.894159 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tvlsi>
rdfs:label Partitioning sequential circuits for pseudoexhaustive testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bassam_Shaer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/David_L._Landis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sami_A._Al-Arian>
swrc:number 5 (xsd:string)
swrc:pages 534-541 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tvlsi/ShaerAL00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tvlsi/ShaerAL00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi8.html#ShaerAL00>
rdfs:seeAlso <https://doi.org/10.1109/92.894159>
dc:title Partitioning sequential circuits for pseudoexhaustive testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 8 (xsd:string)