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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tvlsi/SwahnH08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Brian_Swahn>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Soha_Hassoun>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTVLSI.2008.2000455>
foaf:homepage <https://doi.org/10.1109/TVLSI.2008.2000455>
dc:identifier DBLP journals/tvlsi/SwahnH08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTVLSI.2008.2000455 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tvlsi>
rdfs:label Electro-Thermal Analysis of Multi-Fin Devices. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Brian_Swahn>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Soha_Hassoun>
swrc:number 7 (xsd:string)
swrc:pages 816-829 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tvlsi/SwahnH08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tvlsi/SwahnH08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi16.html#SwahnH08>
rdfs:seeAlso <https://doi.org/10.1109/TVLSI.2008.2000455>
dc:title Electro-Thermal Analysis of Multi-Fin Devices. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 16 (xsd:string)