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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/tvlsi/VoyiatzisGP05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Antonis_M._Paschalis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dimitris_Gizopoulos>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ioannis_Voyiatzis>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTVLSI.2005.857159>
foaf:homepage <https://doi.org/10.1109/TVLSI.2005.857159>
dc:identifier DBLP journals/tvlsi/VoyiatzisGP05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTVLSI.2005.857159 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/tvlsi>
rdfs:label Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Antonis_M._Paschalis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dimitris_Gizopoulos>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ioannis_Voyiatzis>
swrc:number 9 (xsd:string)
swrc:pages 1079-1086 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/tvlsi/VoyiatzisGP05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/tvlsi/VoyiatzisGP05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi13.html#VoyiatzisGP05>
rdfs:seeAlso <https://doi.org/10.1109/TVLSI.2005.857159>
dc:title Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 13 (xsd:string)